New Fault Models and Self-Test Generation for Microprocessors using High-Level Decision Diagrams

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Authors: Jasnetski, Artjom; Raik, Jaan; Tsertov, Anton; Ubar, Raimund

Journal title: IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - DDECS

Journal publisher: IEEE Computer Society Press

Published year: 2015

Published pages: 1-6