Assessment of diagnostic test for automated bug localization

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Authors: Valentin Tihhomirov, Anton Tsepurov, Maksim Jenihhin, Jaan Raik, Raimund Ubar

Journal title: 2013 14th Latin American Test Workshop - LATW

Journal publisher: IEEE

Published year: 2013

Published pages: 1-6

DOI identifier: 10.1109/LATW.2013.6562665

ISBN: 978-1-4799-0597-3