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Authors: Maksim Gorev, Raimund Ubar, Peeter Ellervee, Sergei Devadze, Jaan Raik, Mart Min
Journal title: 2013 NORCHIP
Journal publisher: IEEE
Published year: 2013
Published pages: 1-6
DOI identifier: 10.1109/NORCHIP.2013.6702000
ISBN: 978-1-4799-1647-4