Identifying NBTI-Critical Paths in Nanoscale Logic

Summary

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Authors: Ubar, Raimund; Vargas, Fabian; Jenihhin, Maksim; Raik, Jaan; Kostin, Serge; Bolzani Poehls, Letícia

Journal title: Proceedings of the 16th Euromicro Conference on Digital System Design

Journal publisher: IEEE Computer Society Press

Published year: 2013

Published pages: 136–141