Calculations and surface quality measurements of high-asymmetry angle x-ray crystal monochromators for advanced x-ray imaging and metrological applications

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Authors: Zdenko Zápražný, Dušan Korytár, Matej Jergel, Peter Šiffalovic, Edmund Dobrocka, Patrik Vagovic, Claudio Ferrari, Petr Mikulík, Maksym Demydenko, Marek Mikloška

Journal title: Optical Engineering

Journal number: 00913286

Journal publisher: S P I E - International Society for Optical Engineering

Published year: 2015

Published pages: 035101

DOI identifier: 10.1117/1.OE.54.3.035101

ISSN: 0091-3286