Fine-Grained Vulnerability Analysis of Resource Constrained Neural Inference Accelerators

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Authors: P. Corneliou, P. Nikolaou, M.K. Michael and T. Theocharides

Journal title: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

Journal publisher: IEEE

Published year: 2021

DOI identifier: 10.1109/dft52944.2021.9568281