Robust Machine Learning Systems: Challenges, Current Trends, Perspectives, and the Road Ahead

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Muhammad Shafique; Mahum Naseer; Theocharis Theocharides; Christos Kyrkou; Onur Mutlu; Lois Orosa; Jungwook Choi

Journal title: IEEE Design & Test

Journal publisher: IEEE Computer Society

Published year: 2020

DOI identifier: 10.1109/mdat.2020.2971217

ISSN: 2168-2356