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Authors: Christos Kyrkou, George Plastiras, Theocharis Theocharides, Stylianos I. Venieris, Christos-Savvas Bouganis
Journal title: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Journal publisher: IEEE
Published year: 2018
Published pages: 967-972
DOI identifier: 10.23919/DATE.2018.8342149
ISBN: 978-3-9819263-0-9
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