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Authors: P. Madhukar Reddy, Stavros Hadjitheophanous, Vassos Soteriou, Paul V. Gratz, Maria K. Michael
Journal title: 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)
Journal publisher: IEEE
Published year: 2017
Published pages: 113-119
DOI identifier: 10.1109/IOLTS.2017.8046205
ISBN: 978-1-5386-0352-9
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