A probabilistic approach for failure localization

Summary

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Authors: Tania Panayiotou, Sotirios P. Chatzis, Georgios Ellinas

Journal title: 2017 International Conference on Optical Network Design and Modeling (ONDM)

Journal publisher: IEEE

Published year: 2017

Published pages: 1-6

DOI identifier: 10.23919/ONDM.2017.7958555

ISBN: 978-3-901882-93-7