Dynamic IEEE Test Systems for Transient Analysis

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Authors: Panayiotis Demetriou, Markos Asprou, Jairo Quiros-Tortos, Elias Kyriakides

Journal title: IEEE Systems Journal

Journal number: 11/4

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2017

Published pages: 2108-2117

DOI identifier: 10.1109/JSYST.2015.2444893

ISSN: 1932-8184