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Authors: Michael A. Skitsas, Chrysostomos A. Nicopoulos, Maria K. Michael
Journal title: Journal of Electronic Testing
Journal number: 34/1
Journal publisher: Kluwer Academic Publishers
Published year: 2018
Published pages: 67-81
DOI identifier: 10.1007/s10836-018-5706-0
ISSN: 0923-8174