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Authors: Andreas Kouloumpris, Maria K. Michael, Theocharis Theocharides
Journal title: 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)
Journal publisher: IEEE
Published year: 2019
Published pages: 200-203
DOI identifier: 10.1109/IOLTS.2019.8854422
ISBN: 978-1-7281-2490-2