An overview of next-generation architectures for machine learning: Roadmap, opportunities and challenges in the IoT era

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Authors: Muhammad Shafique, Theocharis Theocharides, Christos-Savvas Bouganis, Muhammad Abdullah Hanif, Faiq Khalid, Rehan Hafiz, Semeen Rehman

Journal title: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)

Journal publisher: IEEE

Published year: 2018

Published pages: 827-832

DOI identifier: 10.23919/date.2018.8342120

ISBN: 978-3-9819263-0-9