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Authors: Markos Asprou, Elias Kyriakides, Mihaela M. Albu
Journal title: IEEE Transactions on Instrumentation and Measurement
Journal number: 68/8
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2019
Published pages: 2808-2818
DOI identifier: 10.1109/tim.2018.2867966
ISSN: 0018-9456