In-line phase contrast tomography of the breast with a dedicated micro-CT scanner

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Authors: Giovanni Mettivier, Kristina Bliznakova, Antonio Sarno, Francesca Di Lillo, Roberta Castriconi, Paolo Russo

Journal title: 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD)

Journal publisher: IEEE

Published year: 2016

Published pages: 1-3

DOI identifier: 10.1109/NSSMIC.2016.8069591

ISBN: 978-1-5090-1642-6