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Authors: Halwachs, M.; Rennhofer, M; Galleano, R.; Zaaiman, W.; Pravettoni, M.; Theristis, M.; Phinikarides, A.; Riedel N.
Journal title: 35th EU PVSEC
Journal publisher: IEEE
Published year: 2018
DOI identifier: 10.5281/zenodo.2581004