The effect of shunt resistance on External Quantum Efficiency measurements at high light bias conditions

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Authors: V. Paraskeva, M. Hadjipanayi, M. Norton, M. Pravettoni and G. E. Georghiou

Journal title: 40th IEEE Photovoltaic Specialist Conference, 40PVSC, 8-13 June

Journal publisher: IEEE

Published year: 2014