Application of an analytical model based on transistor concepts for the characterization of Potential Induced Degradation in crystalline silicon photovoltaics

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Authors: N. Kindyni and G. E. Georghiou

Journal title: 39th IEEE Photovoltaic Specialist Conference, 39PVSC, 16-21 June, Tampa, Florida, USA, 2013

Journal publisher: IEEE

Published year: 2013