Planar Dual‐Gate Paper/Oxide Field Effect Transistors as Universal Logic Gates

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Authors: Diana Gaspar Jorge Martins Pydi Bahubalindruni Luís Pereira Elvira Fortunato Rodrigo Martins

Journal title: Advanced Electronic Materials

Journal publisher: Wiley

Published year: 2018

DOI identifier: 10.1002/aelm.201800423

ISSN: 2199-160X