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Authors: S. Ilic, A. Jevtic, S. Stankovic, V. Davidovic
Journal title: 2019 IEEE 31st International Conference on Microelectronics (MIEL)
Journal number: 16-18 Sept. 2019
Journal publisher: IEEE
Published year: 2019
Published pages: 67-70
DOI identifier: 10.1109/miel.2019.8889570
ISBN: 978-1-7281-3419-2