Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress

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Authors: Sandra Veljković, Nikola Mitrović, Vojkan Davidović, Snežana Golubović, Snežana Djorić-Veljković, Albena Paskaleva, Dencho Spassov, Srboljub Stanković, Marko Andjelković, Zoran Prijić, Ivica Manić, Aneta Prijić, Goran Ristić, and Danijel Danković

Journal title: Journal of Circuits, Systems and Computers

Journal number: 31/18

Journal publisher: World Scientific Publishing Co

Published year: 2022

Published pages: 2240003

DOI identifier: 10.1142/s0218126622400035

ISSN: 0218-1266