PS-BBICS: Pulse stretching bulk built-in current sensor for on-chip measurement of single event transients

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Authors: Marko Andjelkovic; Milos Marjanovic; Junchao Chen; Stefan Ilic; Goran Ristic; Milos Krstic

Journal title: Microelectronics Reliability

Journal number: 138

Journal publisher: Elsevier BV

Published year: 2022

Published pages: 114726

DOI identifier: 10.1016/j.microrel.2022.114726

ISSN: 0026-2714