Feasibility of applying an electrically programmable floating-gate MOS transistor in radiation dosimetry

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Authors: S. Ilic, A. Jevtic, S. Stankovic, V. Davidovic

Journal title: 2019 IEEE 31st International Conference on Microelectronics (MIEL)

Journal number: 31/1

Journal publisher: IEEE

Published year: 2019

Published pages: 67-70

DOI identifier: 10.1109/miel.2019.8889570

ISBN: 978-1-7281-3419-2