Recharging process of commercial floating-gate MOS transistor in dosimetry application

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Authors: Stefan Ilić; Stefan Ilić; Marko Andjelkovic; Russell Duane; Alberto J. Palma; M. Sarajlic; Srboljub Stanković; Goran S. Ristić

Journal title: Microelectronics Reliability

Journal number: 126

Journal publisher: Elsevier BV

Published year: 2021

Published pages: 114322

DOI identifier: 10.1016/j.microrel.2021.114322

ISSN: 0026-2714