Sensitivity and fading of irradiated RADFETs with different gate voltages

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Authors: Goran S. Ristic; Stefan D. Ilic; Marko S. Andjelkovic; Russell Duane; Alberto J. Palma; Antonio M. Lalena; Milos D. Krstic; Aleksandar B. Jaksic

Journal title: Nuclear Inst. and Methods in Physics Research, A

Journal number: 1029

Journal publisher: Elsevier BV

Published year: 2022

Published pages: 166473

DOI identifier: 10.1016/j.nima.2022.166473

ISSN: 0168-9002