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Authors: Ricard Vilalta, Ramon Casellas, Ricardo Martinez, Raul Munoz, Young Lee, Haomian Zheng, Yi Lin, Victor Lopez, Luis Miguel Contreras
Journal title: 2018 International Conference on Optical Network Design and Modeling (ONDM)
Journal publisher: IEEE
Published year: 2018
Published pages: 124-129
DOI identifier: 10.23919/ONDM.2018.8396118
ISBN: 978-3-903176-07-2