NFV-driven intrusion detection for smart manufacturing

Summary

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Authors: Behnke, Daniel; Müller, Marcel; Bök, Patrick-Benjamin; Schneider, Stefan; Peuster, Manuel; Karl, Holger; Rocha, Alberto; Mesquita, Miguel; Bonnet, José

Journal number: 17

Journal publisher: IEEE

Published year: 2019

DOI identifier: 10.5281/zenodo.3707816