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Authors: M. Bielski, I. Syrigos, K. Katrinis, D. Syrivelis, A. Reale, D. Theodoropoulos, N. Alachiotis, D. Pnevmatikatos, E.H. Pap, G. Zervas, V. Mishra, A. Saljoghei, A. Rigo, J. Fernando Zazo, S. Lopez-Buedo, M. Torrents, F. Zyulkyarov, M. Enrico, O. Gonzalez de Dios
Journal title: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Journal publisher: IEEE
Published year: 2018
Published pages: 1093-1098
DOI identifier: 10.23919/DATE.2018.8342174
ISBN: 978-3-9819263-0-9