Investigation of Electrically Active Defects in SiC Power Diodes Caused by Heavy Ion Irradiation

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Authors: N. Für; Manuel Belanche; C. Martinella; Piyush Kumar; Marianne E. Bathen; U. Grossner

Journal title: IEEE Transactions on Nuclear Science

Journal number: 70

Journal publisher: IEEE Transactions on Nuclear Science

Published year: 2023

Published pages: 1892 - 1899

DOI identifier: 10.1109/tns.2023.3242760

ISSN: 1558-1578