Towards Understanding the Value of False Positives in Static Code Analysis

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Authors: Carlo Dimastrogiovanni, Nuno Laranjeiro

Journal title: 2016 Seventh Latin-American Symposium on Dependable Computing (LADC)

Journal number: October 19-21, 2016

Journal publisher: IEEE

Published year: 2016

Published pages: 119-122

DOI identifier: 10.1109/LADC.2016.25

ISBN: 978-1-5090-5120-5