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Authors: Georgios Karakonstantis, Konstantinos Tovletoglou, Lev Mukhanov, Hans Vandierendonck, Dimitrios S. Nikolopoulos, Peter Lawthers, Panos Koutsovasilis, Manolis Maroudas, Christos D. Antonopoulos, Christos Kalogirou, Nikos Bellas, Spyros Lalis, Srikumar Venugopal, Arnau Prat-Perez, Alejandro Lampropulos, Marios Kleanthous, Andreas Diavastos, Zacharias Hadjilambrou, Panagiota Nikolaou, Yiannakis Sazei
Journal title: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Journal publisher: IEEE
Published year: 2018
Published pages: 1099-1104
DOI identifier: 10.23919/date.2018.8342175
ISBN: 978-3-9819263-0-9
- Not specified