Relaxing DRAM refresh rate through access pattern scheduling: A case study on stencil-based algorithms

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Authors: Konstantinos Tovletoglou, Dimitrios S. Nikolopoulos, Georgios Karakonstantis

Journal title: 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)

Journal publisher: IEEE

Published year: 2017

Published pages: 45-50

DOI identifier: 10.1109/iolts.2017.8046197

ISBN: 978-1-5386-0352-9