Significance-Driven Data Truncation for Preventing Timing Failures

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Authors: Ioannis Tsiokanos, Lev Mukhanov, Dimitrios S. Nikolopoulos, Georgios Karakonstantis

Journal title: IEEE Transactions on Device and Materials Reliability

Journal number: 19/1

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2019

Published pages: 25-36

DOI identifier: 10.1109/tdmr.2019.2898949

ISSN: 1530-4388