DRAM Characterization under Relaxed Refresh Period Considering System Level Effects within a Commodity Server

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Authors: Lev Mukhanov, Konstantinos Tovletoglou, Dimitrios S. Nikolopoulos, Georgios Karakonstantis

Journal title: 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)

Journal publisher: IEEE

Published year: 2018

Published pages: 236-239

DOI identifier: 10.1109/iolts.2018.8474184

ISBN: 978-1-5386-5992-2