Power Integrity Analysis of a 28 nm Dual-Core ARM Cortex-A57 Cluster Using an All-Digital Power Delivery Monitor

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Authors: Paul N. Whatmough, Shidhartha Das, Zacharias Hadjilambrou, David M. Bull

Journal title: IEEE Journal of Solid-State Circuits

Journal number: 52/6

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2017

Published pages: 1643-1654

DOI identifier: 10.1109/JSSC.2017.2669025

ISSN: 0018-9200