A System-Level Voltage/Frequency Scaling Characterization Framework for Multicore CPUs

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Authors: G.Papadimitriou, M.Kaliorakis, A.Chatzidimitriou, D.Gizopoulos (U Athens), G.Favor, K.Sankaran and S.Das

Journal title: 13th IEEE Workshop on Silicon Errors in Logic – System Effects 2017 (SELSE 2017)

Journal publisher: IEEE

Published year: 2017