RT Level vs. Microarchitecture-Level Reliability Assessment: Case Study on ARM(R) Cortex(R)-A9 CPU

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Authors: Athanasios Chatzidimitriou, Manolis Kaliorakis, Dimitris Gizopoulos, Maurizio Iacaruso, Mauro Pipponzi, Riccardo Mariani, Stefano Di Carlo

Journal title: 2017 47th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W)

Journal publisher: IEEE

Published year: 2017

Published pages: 117-120

DOI identifier: 10.1109/DSN-W.2017.16

ISBN: 978-1-5386-2272-8