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Authors: George Papadimitriou, Manolis Kaliorakis, Athanasios Chatzidimitriou, Charalampos Magdalinos, Dimitris Gizopoulos
Journal title: 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)
Journal publisher: IEEE
Published year: 2017
Published pages: 51-56
DOI identifier: 10.1109/iolts.2017.8046198
ISBN: 978-1-5386-0352-9
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