Smart Systems Everywhere – How Much Smartness Is Tolerable?

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Authors: Erwin, Schoitsch

Journal title: IDIMT 2017

Journal number: 46

Journal publisher: Trauner Verlag

Published year: 2017

Published pages: 361-373

DOI identifier: 10.5281/zenodo.1043960

ISBN:978-3-99062-119-6