Cryogenic Characterization of the High-Frequency and Noise Performance of SiGe HBTs from DC to 70 GHz and Down to 2 K

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Authors: S. Bonen, G. Cooke, T. Jager, A. Bharadwaj, S. Pati Tripathi, D. Céli, P. Chevalier, P. Schvan, and S. P. Voinigescu

Journal title: IEEE Microwave and Wireless Components Letters

Journal number: Vol. 32, N.6

Journal publisher: IEEE

Published year: 2022

Published pages: pp. 666-669

DOI identifier: 10.1109/lmwc.2022.3160716

ISSN: 1558-1764