Prospects for electrochemical X-ray photoelectron spectroscopy as a powerful electrochemical interface characterization technique

Summary

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Authors: Sheena Louisia, Marc T.M. Koper, Rik V. Mom

Journal title: Current Opinion in Electrochemistry

Journal number: 45

Journal publisher: Elsevier B.V.

Published year: 2024

Published pages: 101462

DOI identifier: 10.1016/j.coelec.2024.101462

ISSN: 2451-9111