Strong-Field Bloch Electron Interferometry for Band-Structure Retrieval

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Authors: Tobias Weitz, Christian Heide, Peter Hommelhoff

Journal title: Physical Review Letters

Journal number: 132

Journal publisher: APS

Published year: 2024

Published pages: 206901

DOI identifier: 10.1103/physrevlett.132.206901

ISSN: 1079-7114