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Authors: Nikos Foutris, Christos Kotselidis, Mikel Lujan
Journal title: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Journal publisher: IEEE
Published year: 2019
Published pages: 1-6
DOI identifier: 10.1109/dft.2019.8875468
ISBN: 978-1-7281-2260-1