Effect of Induced Stimuli on the Leakage Current of Operative Oxide-based Devices inside a TEM

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Authors: Oscar Recalde, Tianshu Jiang, Robert Eilhardt, Alexander Zintler, Yating Ruan, Alexey Arzumanov, Tijn van Omme, Gin Pivak, Hector H. Perez-Garza, Philipp Komissinskiy, Lambert Alff, Leopoldo Molina-Luna

Journal title: Microsc. Microanal.

Journal publisher: Oxford Publishing

Published year: 2022

DOI identifier: 10.1017/s1431927622003671