The Use of High-Energy X-Ray Generators for TID Testing of Electronic Devices

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Authors: Vincent Girones, Jérôme Boch, Alain Carapelle, Arnaud Chapon, Tadec Maraine, Timothee Labau, Frédéric Saigné, Rubén García Alía

Journal title: IEEE Transactions on Nuclear Science

Journal number: 70

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2023

Published pages: 1982-1989

DOI identifier: 10.1109/tns.2023.3279626

ISSN: 0018-9499