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Authors: Lucas Matana Luza, Daniel Söderström, Helmut Puchner, Rubén García Alía, Manon Letiche, Carlo Cazzaniga, Alberto Bosio, Luigi Dilillo
Journal title: Microelectronics Reliability
Journal number: 128
Journal publisher: Elsevier BV
Published year: 2022
Published pages: 114406
DOI identifier: 10.1016/j.microrel.2021.114406
ISSN: 0026-2714
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