Evaluation of a Simplified Modeling Approach for SEE Cross-Section Prediction: A Case Study of SEU on 6T SRAM Cells

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Cleiton M. Marques, Frédéric Wrobel, Ygor Q. Aguiar, Alain Michez, Frédéric Saigné, Jérôme Boch, Luigi Dilillo, Rubén García Alía

Journal title: Electronics

Journal number: 13

Journal publisher: Electronics

Published year: 2024

Published pages: 1954

DOI identifier: 10.3390/electronics13101954

ISSN: 2079-9292