Stripe noise removal in conductive atomic force microscopy

Summary

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Authors: Mian Li, Jan Rieck, Beatriz Noheda, Jos B. T. M. Roerdink, Michael H. F. Wilkinson

Journal title: Scientific Reports

Journal number: 14

Journal publisher: Nature Publishing Group

Published year: 2024

DOI identifier: 10.1038/s41598-024-54094-w

ISSN: 2045-2322