Summary
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Authors: Yan Chen, Ke Tang, Boyuan Gou, Feng Jiang, Xiangdong Ding, Ekhard K. H. Salje
Journal title: Journal of Applied Physics
Journal number: 132
Journal publisher: American Institute of Physics
Published year: 2024
DOI identifier: 10.1063/5.0098813
ISSN: 0021-8979
